Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si-SiO2 interface.
نویسندگان
چکیده
An achromatic infrared (lambda = 1.2-4 microm), Si-prism quarter-wave retarder (QWR) is described that uses total internal reflection at a buried Si-SiO2 interface at an angle of incidence phi near 33 degrees, where deltaDelta/deltaphi = 0. The retardance delta deviates from 90 degrees by < +/- 2 degrees within a field of view of +/- 10 degrees (in air) over the entire bandwidth. Because the SiO2 layer at the base of the prism is optically thick, this QWR is unaffected by environmental contamination.
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عنوان ژورنال:
- Journal of the Optical Society of America. A, Optics, image science, and vision
دوره 21 10 شماره
صفحات -
تاریخ انتشار 2004